Dynamic Light Scattering Instrument: Litesizer DLS 101

Litesizer DLS delivers best-in-class particle sizing with automatic angle selection to prevent errors, while MAPS technology yields the highest-possible peak resolution. Continuous transmittance monitoring detects sedimentation and agglomeration during measurement, enhancing measurement reliability.

  • Particle sizing from 0.3 nm to 10 µm
  • Cost-effective entry to dynamic light scattering
  • DLS back-scatter detection ensures broad sample coverage
  • Transmittance measurement to live-monitor sample behavior


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Features

Three angles, real-time monitoring for better sizing

Litesizer DLS offers the choice between three different detection angles to measure a wide array of samples, while eliminating errors with automatic angle selection.
The Multi-Angle Particle Sizing (MAPS) measurement mode delivers exceptional resolution, supporting advanced analytical precision.
Unique to the market, our continuous transmission monitoring provides live feedback on sample behavior throughout measurement, giving users instant information on sedimentation or agglomeration. This real-time insight enhances measurement quality and reliability, making our system the optimal choice for accurate and dependable particle analysis.

Market-leading zeta potential analysis

Our dynamic light scattering instrument’s patented cmPALS technique is uniquely designed to eliminate reproducibility uncertainties caused by aging effects.
Additionally, the Omega Cuvette’s innovative design minimizes the gradient in the electrical field, further enhancing reproducibility (± 3 %). With an industry-leading particle size range for zeta potential measurement, from 1.3 nm to 100 µm, our instrument offers the broadest capability available, ensuring precise and consistent results across a vast array of applications.

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